SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards 15 nm CAFM or SSRM DESCRIPTION

CAFM or SSRM DESCRIPTION

Imaging in both secondary and back scattered mode is very high

Heater/cooler fluid cell kit DESCRIPTION

5KHZ DESCRIPTION

Sold in 2 sizes: a container holding 1 pint (473ml) or a container holding 50 grams (approx

SEM Magnification Standard and Stage Micrometer MRS-4 - Magnification Reference Standards 15 nm CAFM or SSRM DESCRIPTIONDESCRIPTION MRS 4 Reference Standard, X, Not Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted MRS 4 Reference Standard, X Y Z, Traceable, without Protective Retainer, Unmounted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron