RTESPA-300 80 nm Max W = 50 nm

Max W = 50 nm

Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM)

Built on the high-performance RFESP-75 AFM probe

The tip is designed to be ultra high strength and is fabricated by precision grinding of a solid diamond

In mechanical applications

RTESPA-300 80 nm Max W = 50 nm40N m, 300kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode andother non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the most