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820-017-300 Critical Dimension (Overhang) High performance contact resonance imaging

SKU: 87634294812

4.5
USD78.88 USD100.88

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Ships within 48 hours · Estimated delivery Aug 22 - Aug 27

Description

High performance contact resonance imaging with Dimension Icon

Max Overhang = 30 nm

"A" Cantilever: 10

Al Reflex Coating

- TERS probes for 633 nm or 785 nm excitation using STM feedback

820-017-300 Critical Dimension (Overhang) High performance contact resonance imagingMultiMode Application Module Signal Access Wire DESCRIPTION Replacement signal access wire for MultiMode application modules. Not compatible with MM SCM CH. Quantity 1

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