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Focused Ion Beam (FIB) probes consist of an integrated single crystal TESP silicon cantilever and tip that have been machined (or shaped) toobtain the desired high aspect ratio
40N/m nominal
A pack of Silicon Nitride Probes
Automatic image optimization for faster
Cantilever Material: Silicon Nitride Cantilever Thickness (Nom): 0
MFMA 150 kHz Focused Ion Beam (FIB) probesForce Modulation cantilever holder DESCRIPTION TIP SPECIFICATIONS This stainless steel cantilever holder includes a large piezo to drive the tip for low frequency, high amplitude force imaging in air. It can also be used for Tapping and Contact modes. This option includes a force imaging support note and a set of probes. Not compatible with LFM SPMs. This stainless steel cantilever holder includes a large piezo to drive the tip for low frequency, high
