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but where high conductivity is required
determination of lateral and vertical scanner nonlinearity
as encountered on semiconductor samples and optics
This option includes a force imaging support note and a set of probes
5pk Cantilever Thickness (Nom): 1
PELCO® 150 Mesh Grids s-SNOM Probes but where high conductivity isDESCRIPTION SIZE SPECIFICATIONS 150: Pitch 169m; Hole Width 125m; Bar Width 44m; Transmission 60% PELCO Center Marked Grids, 150 mesh, 3. 0mm O. D., Copper, 100 vial PELCO Center Marked Grids, 150 mesh, 3. 0mm O. D., Nickel, 100 vial PELCO Center Marked Grids, 150 mesh, 3. 0mm O. D., Gold, 25 vial, 25 vial Tabbed PELCO Tabbed Center Marked Grids, 150 mesh, 3. 0mm O. D., Copper, 100 vial PELCO Tabbed Center Marked Grids, 150 mesh, 3. 0mm O. D., Nickel,
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