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SPM cross-sectional sample holder for all Veeco SPMs
PLEASE NOTE: Sample cross-sectioning by cleaving or polishing is required
and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs
High aspect ratio probe for small scale structures
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RFESPA-40
RFESPA-75 Caliber SPM cross-sectional sample holder for3N m, 75kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingModeimaging and force modulation in air. Unmounted for use on standardAFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide
