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Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods
The fabrication process ensures excellent uniformity of the structures across the chip
Transfer Atomic Force Microscopy Discs from Diskpenser to PELCO® AFM Workstation to Microscope and to PELCO® AFM Disc Carrier or AFM Disc Storage Box with ease
The kit contains 8 numbered 15mm AFM discs with mica attached for calibration and tip characterization
***Note: Bruker's new MESP-V2 probe replaces the legacy MESP probe
SiC-STEP Calibration Samples 300 Mesh Theseprobes also have a tipDESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
US$ 169.00
US$ 198.00
