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2mm (5-7/8")
16011 - Ø1" Silicon Wafer
instrumentation used
Takes less space with a head diameter of 6
56-75 - Highest Grade V1 Mica
PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM) Soft Tapping Mode 2mm (5-7/8")DESCRIPTION inexpensive characterization of instrument performance The NiOx Test Specimen has been developed for advanced analytical TEM's equipped with X Ray Micro Analysis Systems (EDX) and or Electron Energy Loss Spectrometers (EELS) to characterize instrument performance. It consists of a 55nm layer of NiOx on a 25nm carbon support film on a 200 mesh Mo TEM grid. The NiOx Test Specimen is valuable in at least three ways: When evaluating TEM's and
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