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Includes a subset of PeakForce QNM samples
Built on the high-performance RESP-10 AFM probe
REQUIRES a minimum of one-day installation/training (Model ITCSA)which must be purchased separately when purchased with any other on-siteinstallation/training package (Models ITCS or ITCS3)
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2
and their combination with PeakForce QNM
DDESP-FM-V2 1 N/m Includes a subset of PeakForce6 N m, 105 kHz, Conductive Doped Diamond Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker DDESP FM V2 Electrical Probes Providing consistent performance and high sensitivity. Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and
