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5+/-5deg Tip Radius (Nom): 20nm Tip Coating: Highly conductive single cystal diamond Tilt Compensation: 4 +/- 1deg
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This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RFESP-40
The Pt-Ir coating on the front side of the cantilever provides ametallic electrical path from the cantilever die to the apex of the tip
Pre-mounted on a 12mmmagnetic sample disk
DDESP-V2 Innova 5+/-5deg Tip Radius (Nom): 20nm80 N m, 450 kHz, Conductive Doped Diamond Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker DDESP V2 Electrical Probes ***Note: Bruker's new DDESP V2 probe replaces the legacy DDESP 10 probe. Bruker recommends transitioning to this probe. The legacy DDESP 10 is no longer available for ordering. Providing consistent performance and high sensitivity. Bruker's new conductive diamond coated probe provides high performance Scanning
