292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids cross-section cannot be taller than

cross-section cannot be taller than the height supported by the microscope

and an entry hole for counter and reference electrodes are integrated into the glass fluid cell

Extra bars provide better support over a large area

10 & 20nm range

5mm square and is unmounted

292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids cross-section cannot be taller thanDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable