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Ships within 48 hours · Estimated delivery Sep 3 - Sep 8
Max Overhang = 8 nm
Aspect ratio of 12:1 at 8um from tip apex
8 Cantilever Thickness (RNG): 2
Cantilever Holder for Scanning Capacitance Microscopy with the MultiMode SPM
Note: Requires specialized probe holder (part of the VITA module)
RESP-40 1 N/m Max Overhang = 8 nm5N m, 40kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker's flagship RESP probes are the preferred choice for high sensitivity silicon probe imaging in contact mode in air. Every aspect of the RESP design has been optimized to provide the most accurate profiling of microscopic
