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CamScan) on standard Hitachi M4 thread
HIGH ASPECT RATIO tip
Refrigeration will increase shelf life but a warm up period of one hour is then required before use
Holds Hitachi M4 mounts secure on M4 screw adapters
thermal stability in air up to 600°C and in vacuum or inert gas up to 3
BSE Atomic Reference Specimen Dumont 70 CamScan) on standard Hitachi M4DESCRIPTION Back Scattered Electron Test Specimens An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen. Four reference specimens are now available that are suitable for testing the atomic number contrast performance of a backscattered electron detection system. Each of the reference specimens
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