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mends and secures glass
it easily chips
Note: Uncoated probes cannot be used for imaging or force measurementswithout a reflective coating added by the user
nominal 88nm (880A)
Transmission 35%
SEM Magnification Standard and Stage Micrometer MRS-4 - Specimen Mounts 2D mends and secures glassDESCRIPTION Mounting MRS 3 4 Retainer on 1" (25. 4mm) Pin Stub with a 1 8" (3. 2mm) pin, for #614 5 only Mounting MRS 3 4 Retainer on Hitachi 25x10mmxM4 Cylinder Mount, for #614 5 only The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version)
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