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the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
If a conductive coating is not needed
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices
2 nm respectively
Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 15 Tip Radius (Max): <10 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3
AD-40-P40 Automated AFM the RTESPA-300-30 provides accurate nanomechanicalDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 40nm base diameter, combined with a high 40N m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM. Tip Geometry:
