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Ships within 48 hours · Estimated delivery Aug 31 - Sep 5
Refer to calibration certificate for actual pitch
25 Cantilever Thickness (RNG): 0
One cartridge for IRIS STM TERS
Cantilever mounts DESCRIPTION
mounted on 12mm AFM/STM Specimen Disc
HS-Series AFM Calibration Standards Wire Cutting Refer to calibration certificate forDESCRIPTION Step heights of 20, 100 or 500nm. The HS series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z axis calibration the standards also offer X and Y axis calibration for bigger scanners in the 40 100um range. The structure symmetry enables calibration without the need to rotate and re align the sample in between x and Y axis calibration. The HS series feature silicon dioxide
US$ 430.00
US$ 435.00
US$ 965.00
