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Ships within 48 hours · Estimated delivery Aug 23 - Aug 28
This holder supports Electrostatic Force Microscopy (EFM)
658-200-AU - Quantifoil®
acid resistant
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2
Hard and strong (hardness = 230 HV1)
Tipcheck AFM Tip Characterizer PELCO® Grids This holder supports Electrostatic ForceSample for Analyzing AFM Tip Geometry DESCRIPTION Sample for Analyzing AFM Tip Geometry The problem: Blunt or broken tips falsify measurement results like surface roughness or structures dimensions dramatically! To ensure correct results, used tips must be thrown away or checked by SEM regularly, both methods being extremely uneconomic or time consuming. The solution: The TipCheck is an SPM sample for fast and convenient determination of the AFM tip
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