Pelcotec™ CDMS-XY-0.1T 8 nm The final thickness of the

The final thickness of the foil is about 20nm

This stub is not coated for conductivity and is useful to demonstrated low-vacuum SEM imaging

I - SDS (47KB PDF)

250 and 100 nm) — ✓ NIST traceable ✓ ✓ Certification available ✓ ✓ Unmounted ✓ ✓ Mounts A-R available ✓ ✓ Precision better than 0

From 10µm To 20µm Tip Radius < 10nm Half Cone Angle 20°-25° along cantilever axis

Pelcotec™ CDMS-XY-0.1T 8 nm The final thickness of theDESCRIPTION PRODUCT SPECIFICATIONS NIST traceable* with features from 2mm to 100nm for magnification 10 200,000x for SE, FESEM and FIB *Uses average data measured for each production wafer. Feature sizes: 2mm, 1mm, 0. 5mm, 0. 1mm, 50m, 10m, 5m, 2m, and 1m, 500nm, 250nm and 100nm See mount selections, types A R Pelcotec CDMS XY Critical Dimension Magnification Standard Available as NIST Traceable or as Certified against NIST Standard Easy to use and