CDR50S PeakForce Tapping Enabled Bruker AFMProbes Aluminum reflective coating on the

Aluminum reflective coating on the backside of the cantilever

***Note: Bruker's new MESP-V2 probe replaces the legacy MESP probe

these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices

5+/-5deg Tip Radius (Nom): 20nm Tip Coating: Highly conductive single cystal diamond Tilt Compensation: 4 +/- 1deg

Fused silica sample pre-mounted on a 15mm magnetic disk

CDR50S PeakForce Tapping Enabled Bruker AFMProbes Aluminum reflective coating on theRound Re Entrant Tips for 3 D imaging Max W = 50 nm, Max OH = 8 nm, Max EL = 260 nm DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Round Re Entrant Tips for 3 D imaging Max Width = 50 nm Max Overhang = 8 nm Max Effective Length = 260 nm Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 20 Tip Set Back( RNG): 5 15 The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2. 5 times.