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creating a film with varying material properties
Max Width = 55 nm
Calibration Artifact: 180nm Depth
Type: P (Boron) (1 primary flat)
This silicon sample specifically includes islands of aluminum and gold thereby enabling one to show surface potential contrast
PR-EX-KPFM-5 19 kHz creating a film with varyingDESCRIPTION 5 pack of tapping mode probes compatible with the nanoIR2 2s 2FS, nanoIR, and afm+ for KPFM measurements and tapping mode imaging. Microfabricated silicon probes that are ~225 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever. Premounted on half washer mounts with a two pin connector for easy exchange and electrical connection to the KPFM module. Requires the KPFM module.
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