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Microfabricated silicon probes that are ~450 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever
75 Cantilever Geometry: Rectangular Cantilevers Number: 1
25um RADIUS
high density polyethylene (HDPE
5N/m nominal
CLST-PTBO 3-degree Automated AFM (InSight 3DAFM Microfabricated silicon probes that are20mm cut Platinum Iridium, 0. 50mm diameter DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of STM Probes Precision cut Platinum Iridium wire for Scanning Tunneling Microscopy. Unmounted for CPII Innova AFMs. Quantity=10 These tips are formed from platinum iridium wire and cut at the end to form the tip. The wire is 0. 5mm in diameter and is recommended for Veeco's Innova and CP II SPMs. Tip Geometry: Solid Wire Cantilever Geometry:
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