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Ships within 48 hours · Estimated delivery Aug 30 - Sep 4
This Cross Section Holder is made of aluminum with spring-loaded brass clamping and grounding clip and holds sample at a 45° angle
only minor impurities of Al and Si may be found
MLCT probes have less than 2deg of cantilever bend
even at high temperatures
Pad of 100 sheets
PELCO X-CHECKER™ Wafer Size:300mm (12") This Cross Section Holder isDESCRIPTION The PELCO X Checker Wafer is available for systems set up for silicon wafer handling. The PELCO X Checker Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations. The #602 20 and #602 21 contain: Copper disc to check spectral calibration Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution Nickel 400 mesh TEM grid for imaging
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