Pay in 4 interest-free payments of $76.85 Learn more
Ships within 48 hours · Estimated delivery Aug 22 - Aug 27
Veeco"s SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes
35 or 50nm Silicon Nitride Support Film
Width x Thickness 5367-16NM PELCO® Pro High Precision
Width x Thickness 5029-2 Ceramic Tip Tweezer
high purity GE124 quartz
Multi75DLC Pin Mount SEM Specimen Holders Veeco"s SPM Calibration Gratings areDiamond Like Carbon Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM). High durability and hydrophobicity due to Diamond Like Carbon coating on tip side of the cantilever. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius
