Magnification Calibration MRS-3 - Cleaning and Re-calibration Service Select:MRS-3/4/5 Cleaning and Re-coating only and afm+ for CAFM measurements

and afm+ for CAFM measurements and contact mode imaging

Silicon tip on Silicon Nitride cantilever

Multi-pitch measurements provide the usual square-root of N improvement in precision

STM tip holder for Dimension 3000 & 5000 series SPMs DESCRIPTION

2 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: cell Back Side Coating: Reflective Aluminum

Magnification Calibration MRS-3 - Cleaning and Re-calibration Service Select:MRS-3/4/5 Cleaning and Re-coating only and afm+ for CAFM measurementsDESCRIPTION MRS 3 X Y R Cleaning, Re coating and Re calibration MRS 3 X Y Z R Cleaning, Re coating and Re calibration MRS 3 4 5 Cleaning and Re coating only The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the pattern height is